Transmission Electron Microscope (TEM)

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Transmission Electron Microscope (TEM)

FEI Tecnai G² 20 200kV TEM/STEM/EDX/Tomography

This microscope can perform various classical technics such as bright field and dark field imaging, diffraction, plus tomography and EDX micro analysis.

Electron source

High tension up to 200 kV
LaB₆ emitter

Imaging

Double-tilt holder (+-40^o tilt)
Tomography holder (+-80^o tilt)
Eucentric side-entry stage
X,Y, Z, a and b coordinates
TEM point resolution 0.24 nm
TEM magnification 25x – 1,030,000x

STEM

STEM resolution 1.0 nm
STEM magnification 100x – 5,000,000x

Diffraction

Micro-diffraction (SAED)
Convergent beam diffraction

Microanalysis

EDX profiling and imaging
LN₂- free detector
Low background holder

Contact : Anuchit Ruengwittayanon, anuchit@sut.ac.th, 044-223193

[Gallery][Instrument Data][Add. Info.]

Transmission Electron Microscope, Part 1 of 2

Transmission Electron Microscope, Part 2 of 2

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