Scanning Electron Microscope (W-SEM)
JEOL JSM-6010LV
This is a user friendly scanning electron microscope aimed to serve a broadband of user levels : from beginner to advanced user. A cryo-stage/loading is added to accommodate biological sample preparation by freeze dry method.
Electron Optics
Tungsten filament
High tension 0.5 kV- 20 kV
Resolution Hi-vac 4 nm @ 20 kV, 15 nm @ 1 kV
Resolution Lo-vac 5 nm @ 20 kV
Magnification 8x – 300,000x
Beam current 1 pA to 300 nA
Auto filament alignment
Beam blanking
Detectors
Hi-vac Mode
SE detector, Everhart-Thornley type
Backscattered electron detector (BED)
Lo-vac Mode
Backscattered electron detector (BED)
Stage
5-axis eucentric stage
X,Y, Z, tilt and rotation coordinates
X 80 mm ,Y 40 mm
Z, WD 5-48 mm
Tilt -10 to 90 degree
Cryostage
Freeze drying
Cutting knife
Cold N2 cooling
Contact : Anuchit Ruengwittayanon, anuchit@sut.ac.th , 044-223193
[Gallery ][Instrument Data ][Add. Info.]
VDO
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