Wavelength Dispersive  X-ray Fluorescence (WDXRF)

PANalytical  AXIOS^mAX  XRF Spectrometer

X-Ray Fluorescence (XRF) is one of the standard analytical technique that utilize the interaction of x-rays with a material to determine the sample’s elemental composition. This type of non-destructive technique is suitable for solid, liquid and powder samples from a variety of applications such as mineral, geology, chemical industry, electronics, archeology, metallurgy, etc.

This industrial-grade wavelength dispersive (WDXRF) unit can provide elemental composition of the sample of interest in accurate detail. The range of elements covers ⁴Be to ⁹²U from ppm to % levels.

X-ray source Rh X-ray tube 50 kV/ 1 mA Mono-capillary guide tubes  Fluorescence Detector High performance scintillation detector Linear dynamic range up to 3.5 Mcps  Analyzer Crystals LiF200, LiF220, Ge111, PE002, PX1  Usability Elements detected 4Be to 92U High precision for transition metals Sample   High capacity sample changer Standard sample size 140 40 mm Multi-position programmable mask Application modules for cement, oxide polymer and metal Oxides standards

Contact :  Komsan Taisrap (คมสัน  ต่ายทรัพย์), e-mail, 044-22xxxx

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