Transmission Electron Microscope (TEM)

December 9th, 2013 admin

Transmission Electron Microscope (TEM)

FEI Tecnai G2 20  200kV TEM/STEM/EDX/Tomography

This microscope can perform various classical technics such as bright field and dark field imaging, diffraction, plus tomography and EDX micro analysis.

Electron source

  •  High tension up to 200 kV
  • LaB6 emitter

Imaging

  • Double-tilt holder (+-40o tilt)
  • Tomography holder (+-80o tilt)
  • Eucentric side-entry stage
  • X,Y, Z,  a and b coordinates
  • TEM point resolution 0.24 nm
  • TEM magnification  25x – 1,030,000x

STEM

  • STEM resolution 1.0 nm
  • STEM magnification 100x – 5,000,000x

Diffraction

  • Micro-diffraction (SAED)
  • Convergent beam diffraction

Microanalysis

  • EDX profiling and imaging
  • LN2- free detector
  • Low background holder
 TEM2
TEM

Contact : Anuchit Ruengwittayanon, anuchit@sut.ac.th, 044-223193

[Gallery][Instrument Data][Add. Info.]

Transmission Electron Microscope, Part 1 of 2

 Transmission Electron Microscope, Part 2 of 2
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