Powder X-ray Diffraction (XRD)

Bruker D8 ADVANCE 

X-ray diffraction is a standard technique for material characterization to obtain micro structural information for crystalline and non-crystalline materials.  This non-destructive method could provide informations such as crystal structure, lattice parameter, crystal size, composition, strain, roughness, texture which are useful for ceramics, metal alloys, semiconductors, polymer, nano-materials research.

X-ray source Ceramic Cu X-ray tube Goniometer Vertical Theta/ Theta Theta/2 Theta 2Theta  from -110 degree to168 degree Smallest step 0.0001 degree Alignment within 0.01 degree Maximum speed  20 deg/s  Detector 1-D (LYNXEYE) Cover 3 deg of 2Theta Optics TWIN/TWIN optics Auto selection Brag-Brentano mode Grazing incident mode Micro diffraction mode Accessory   High temperature furnace & control Eulerian cradle Various types of holder

Contact : Contact :  Yuthika Sroiraya (ยูถิกา  สร้อยระย้า), e-mail, 044-22xxxx

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