Powder X-ray Diffraction (XRD)

Powder X-ray Diffraction (XRD)

Bruker D8 ADVANCE 

X-ray diffraction is a standard technique for material characterization to obtain micro structural information for crystalline and non-crystalline materials.  This non-destructive method could provide informations such as crystal structure, lattice parameter, crystal size, composition, strain, roughness, texture which are useful for ceramics, metal alloys, semiconductors, polymer, nano-materials research.

 X-ray source

  • Ceramic Cu X-ray tube


  • Vertical
  • Theta/ Theta
  • Theta/2 Theta
  • 2Theta  from -110 degree to168 degree
  • Smallest step 0.0001 degree
  • Alignment within 0.01 degree
  • Maximum speed  20 deg/s


  • 1-D (LYNXEYE)
  • Cover 3 deg of 2Theta


  • TWIN/TWIN optics
  • Auto selection
  • Brag-Brentano mode
  • Grazing incident mode
  • Micro diffraction mode


  • High temperature furnace & control
  • Eulerian cradle
  • Various types of holder


Contact : Contact :  Yuthika Sroiraya (ยูถิกา  สร้อยระย้า), e-mail, 044-22xxxx

[Gallery][Instrument Data][Add. Info.]



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