Transmission Electron Microscope (TEM)

Transmission Electron Microscope (TEM)

FEI Tecnai G2 20  200kV TEM/STEM/EDX/Tomography

This microscope can perform various classical technics such as bright field and dark field imaging, diffraction, plus tomography and EDX micro analysis.

Electron source

  •  High tension up to 200 kV
  • LaB6 emitter


  • Double-tilt holder (+-40o tilt)
  • Tomography holder (+-80o tilt)
  • Eucentric side-entry stage
  • X,Y, Z,  a and b coordinates
  • TEM point resolution 0.24 nm
  • TEM magnification  25x – 1,030,000x


  • STEM resolution 1.0 nm
  • STEM magnification 100x – 5,000,000x


  • Micro-diffraction (SAED)
  • Convergent beam diffraction


  • EDX profiling and imaging
  • LN2- free detector
  • Low background holder

Contact : Anuchit Ruengwittayanon,, 044-223193

[Gallery][Instrument Data][Add. Info.]

Transmission Electron Microscope, Part 1 of 2

Transmission Electron Microscope, Part 2 of 2

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