Atomic Force Microscope (AFM)

Atomic Force Microscope (AFM)
Park Systems AFM XE-120

This is a research grade microscope that can perform various modes of Scanning Probe Microscope such as AFM, STM, Conductive AFM, Dielectric/Piezoelectric, Electrical measurement, Force measurement, MFM, Thermal, Liquid etc.

AFM Scanner

  • Closed-loop XY and Z flexure
  • Flat XY scan 100 µm x 100 µm
  • XY resolution 0.05 nm
  • Z scan up to 25 µm
  • Z resolution 0.1 nm
  • SLD Head
  • Low noise floor
  • Acoustic encloser

Standard Imaging

  • True Non-contact mode
  • Dynamic Force Mode (DFM)
  • Contact Mode
  • Lateral Force Microscopy (LFM)
  • Force Distance (F-D) Spectroscopy/
  • Phase imaging

Advanced Modes

  • Force Modulation Microscopy (FMM)
  • Variable Enhanced Conductive AFM
  • Photocurrent Mapping (PCM)
  • Magnetic Force Microscopy (MFM)
  • Nanoindentation
  • Nanolithography mode
  • Scanning Capacitance Microscopy (SCM)
  • Scanning Spread Resistance Microscopy (SSRM)
  • Scanning Tunneling Microscopy (STM)
  • Scanning Thermal Microscopy (SThM)
  • Enhanced Electrostatic Force Microscopy (EFM)
  • Piezoresponse Force Microscopy (PFM)

Technical Advise : Dr. Worasom Kundhikanjana, School of Physics, 044-224319
Contact : Anuchit Ruengwittayanon,, 044-223193

[Gallery][Instrument Data][Add. Info.]

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