Powder X-ray Diffraction (XRD)

Bruker D2 PHASER

X-ray diffraction is a standard technique for material characterization to obtain micro structural information for crystalline and non-crystalline materials.  This non-destructive method could provide informations such as crystal structure, lattice parameter, crystal size, composition etc. which are useful for ceramics, metal alloys, semiconductors, polymer, nano-materials research.

This user-friendly desktop XRD unit is intended to serve novice user with minimal experience such as undergraduate student or teaching assistant.

X-ray source Ceramic Cu X-ray tube 30 kV/ 10 mA Goniometer Vertical circle, Horizontal sample Theta/ Theta 2Theta  from -3 degree to160 degree Alignment within 0.02 degree Detector 1-D (LYNXEYE) Cover 5.5 degree of  2Theta Accessory   Various types of holder

Contact :  Yuthika Sroiraya (ยูถิกา  สร้อยระย้า), e-mail, 044-22xxxx

[Gallery][Instrument Data][Add. Info.]

VDO1