Transmission Electron Microscope (TEM)
JEOL JEM 2010 200kV TEM/EDX

This is a classic transmission electron microscope that can perform both conventional (bright field and dark field) and high resolution imaging with micro area diffraction, plus EDX micro analysis.

Electron source High tension up to 200 kV LaB6 emitter Imaging Double-tilt holder (+-30o tilt) Side-entry stage X,Y  coordinates TEM point resolution 0.25 nm TEM magnification  up to 1,000,000x Diffraction Micro-diffraction (SAED) Convergent beam diffraction Microanalysis EDX point analysis LN2- free detector Low background holder

Contact : Contact :  Anuchit Ruengwittayanon, anuchit@sut.ac.th, 044-223193

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