Atomic Force Microscope (AFM)
Park Systems AFM XE-120
This is a research grade microscope that can perform various modes of Scanning Probe Microscope such as AFM, STM, Conductive AFM, Dielectric/Piezoelectric, Electrical measurement, Force measurement, MFM, Thermal, Liquid etc.
AFM Scanner
- Closed-loop XY and Z flexure
- Flat XY scan 100 µm x 100 µm
- XY resolution 0.05 nm
- Z scan up to 25 µm
- Z resolution 0.1 nm
- SLD Head
- Low noise floor
- Acoustic encloser
Standard Imaging
- True Non-contact mode
- Dynamic Force Mode (DFM)
- Contact Mode
- Lateral Force Microscopy (LFM)
- Force Distance (F-D) Spectroscopy/
- Phase imaging
Advanced Modes
- Force Modulation Microscopy (FMM)
- Variable Enhanced Conductive AFM
- Photocurrent Mapping (PCM)
- Magnetic Force Microscopy (MFM)
- Nanoindentation
- Nanolithography mode
- Scanning Capacitance Microscopy (SCM)
- Scanning Spread Resistance Microscopy (SSRM)
- Scanning Tunneling Microscopy (STM)
- Scanning Thermal Microscopy (SThM)
- Enhanced Electrostatic Force Microscopy (EFM)
- Piezoresponse Force Microscopy (PFM)
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Technical Advise : Dr. Worasom Kundhikanjana, School of Physics, 044-224319
Contact : Anuchit Ruengwittayanon, anuchit@sut.ac.th, 044-223193
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